X-ray background radiation英 [eks reɪ ˈbækɡraʊnd ˌreɪdiˈeɪʃn] ![]() ![]() |
X-ray crystallography英 [eks reɪ ˌkrɪstəˈlɒɡrəfi] ![]() ![]() |
X-ray diffraction英 [eks reɪ dəˈfrækʃən] ![]() ![]() |
X-ray diffraction analysis英 [eks reɪ dəˈfrækʃən əˈnæləsɪs] ![]() ![]() |
X-ray diffractometer英 ![]() ![]() |
X-ray diffractometry英 ![]() ![]() |
X-ray energy spectrometer英 [eks reɪ ˈenədʒi spekˈtrɒmɪtə(r)] ![]() ![]() |
X-ray equipment英 [eks reɪ ɪˈkwɪpmənt] ![]() ![]() |
X-ray escape peak英 [eks reɪ ɪˈskeɪp piːk] ![]() ![]() |
X-ray fault detector英 [eks reɪ fɔːlt dɪˈtektə(r)] ![]() ![]() |
X-ray film英 [eks reɪ fɪlm] ![]() ![]() |
X-ray flaw detector英 [eks reɪ flɔː dɪˈtektə(r)] ![]() ![]() |
X-ray fluorescence英 [eks reɪ ˌflɔːˈresns] ![]() ![]() |
X-ray fluorescence anaiysis英 ![]() ![]() |
X-ray fluorescence analysis英 [eks reɪ ˌflɔːˈresns əˈnæləsɪs] ![]() ![]() |
X-ray fluorescence spectrometer英 [eks reɪ ˌflɔːˈresns spekˈtrɒmɪtə(r)] ![]() ![]() |
X-ray fluorescence spectrometry英 ![]() ![]() |
X-ray fluorescnece analysis英 ![]() ![]() |
X-ray image英 [eks reɪ ˈɪmɪdʒ] ![]() ![]() |
X-ray luminescence英 [eks reɪ ˌluːmɪˈnesns] ![]() ![]() |
X-ray peak broadening英 [eks reɪ piːk ˈbrɔːdnɪŋ] ![]() ![]() |
X-ray photoelectron spectroscopy英 ![]() ![]() |
X-ray photograph英 [eks reɪ ˈfəʊtəɡrɑːf] ![]() ![]() |
X-ray photometer英 [eks reɪ fəʊˈtɒmɪtə] ![]() ![]() |
X-ray photon spectroscopy英 [eks reɪ ˈfəʊtɒn spekˈtrɒskəpi] ![]() ![]() |
X-ray picture英 [eks reɪ ˈpɪktʃə(r)] ![]() ![]() |
X-ray proof rubber英 [eks reɪ pruːf ˈrʌbə(r)] ![]() ![]() |
X-ray shield英 [eks reɪ ʃiːld] ![]() ![]() |
X-ray spectrochemical analysis英 ![]() ![]() |
X-ray spectrograph英 ![]() ![]() |