For applications with high reliability requirement, how to improve system MTTF is one of the key problems. 对数据有高可靠性要求的应用,如何提高系统MTTF是人们研究的主要问题。
Monte Carlo method of MTTF evaluation based on fault tree analysis 基于故障树分析的系统平均寿命评定的MonteCarlo方法
The presented method can be easily used in engineering for MTTF evaluation of large complex system, where limited testing data of unit life time is required. 解决了有限样本条件下,大型复杂系统平均寿命评定问题,对工程中大型复杂系统平均寿命评定具有重要应用价值。
The maximum likelihood estimate and uniformly minimal variance unbiased estimate ( UMVUE) of MTTF were made on the one-unit system whose lifetime was assumed to be on GAMMA distribution. 讨论寿命服从单参数GAMMA分布单元平均寿命的极大似然估计和一致最小方差无偏估计;
The BC_a Intervals for the MTTF of Parallel or Series System 系统平均寿命的BCα区间估计
Monte Carlo Method of MTTF Evaluation for Large Complex System 大型复杂系统平均寿命评定的MonteCarlo方法
Based on reliability diagram modeling and calculation of minimal path sets, Monte Carlo sampling simulation method of MTTF is obtained for large complex system. 基于可靠性框图建模,采用最小路集计算分析,提出了大型复杂系统平均寿命评定的MonteCarlo方法。
The reliability lab ship fuel oil donkey boiler controlled by relay control system is evaluated using counting method, and mean time to failure ( MTTF) of the control circuit is educed. 对采用继电器控制系统进行控制的某实验室船舶燃油辅助锅炉,采用计数法进行可靠性评估,得出控制电路的平均无故障时间。
By concentrating on Mean Time to Repair ( MTTR) rather then Mean Time to Failure ( MTTF), we find that quick recovery reduces recovery time and thus offers higher availability. 通过关注平均修复时间,而不是平均故障时间,发现快速的恢复减少了恢复时间,因而提供了更高的可用性。
Finally obtain the mean time between failures ( MTBF), mean time of repair failures ( MTTF), inherent availability ( A) as well as reliability index such as reliability and failure rate function according to the distribution model. 最后根据分布模型计算得到该加工中心的故障间隔时间(MTBF)、平均维修时间(MTTF)、固有可用度A以及可靠度和失效率函数等可靠性指标。
In this dissertation, a large number of real defects are obtained from the IC. IC defect detection, feature extraction and classification and its influence on signal integrity and MTTF ( Median-Time-To-Fail, MTTF) of IC are studied in detailed. 本文将从IC电路中获取大量的真实缺陷,系统、深入地研究IC缺陷的检测、缺陷的特征提取和分类、缺陷对电路信号完整性的影响以及缺陷对IC中位寿命的影响。
Based on the physical model, the temperature and the MTTF of copper interconnect can be calculated accurately, which can be used as an effective guide to IC designing and manufacturing. 根据该物理模型可以准确计算出互连线具体的温度和寿命数据,可以用于集成电路的设计和工艺制造。