burn-in
英 [bɜːn ɪn]
美 [bɜːrn ɪn]
n. 熔焊；熔接；预烧；老化; 定型
双语例句
- DGUANLONG shall discuss with customer to make sure the power in house Burn-In and life test procedures.
将与客户评估并确认电源产品室内老化寿命测试过程。 - Disclosed herein is A burn-in reduction apparatus, including: an illumination sensor configured to detect brightness of outside light incident on an area near a display screen;
这里公开了一种残影减少设备，包括：照明传感器，被配置以检测显示屏幕附近区域上入射的外界光的亮度； - The radiation effects of the burn-in device differ from those of the non-burn-in device.
这一作用会改变器件对电离辐射的响应。 - When designing a burn-in test system, one task is to determine the best way to switch all the output voltages to be monitored.
在设计老化试验系统时，任务之一就是确定切换所有输出电压的最佳方式。 - Most modern computer screens are immune to burn-in, but we are still addressing this issue for those who are concerned.
绝大多数现代计算机的屏幕是不会被烧坏的，但是我们还是为了那些对此事关注的人将这个问题编入。 - It is non-conductive and does not require a burn-in time to achieve maximal efficiency.
它是不导电，不需要老化时间实现最大的效率。 - Early plasmas had a risk of "burn-in," a situation where a logo or fixed text might remain visible even after you change channels.
早期的等离子技术有被“打上烙印”的危险，即萤幕上出现一个图示或固定文字，甚至在换台之后还能看见。 - Project Demonstration about Electric Burn-in Simulation Load of a Certain Type of Actuator Amplifier
某型舵机放大器电老炼模拟负载方案论证 - Even though power supplies may have several outputs, monitoring a single output is usually sufficient for burn-in testing.
即使电源有多个输出，那么老化试验时监测单个输出通常也就足够。 - Analysis of the Action of Static Power Dissipation in Burn-in Condition on Yield of VLSI monolithically integrated master oscillator power amplifer
集成电路老化温度与耗散功率、频率关系的研究单片集成主振荡器功率放大器 - Burn-in is a manufacturing operation that is intended to eliminate early failure.
预烧是为了减少产品早衰的生产过程必要的手段。 - Our main products are Environmental Chambers, On-line Reliability Evaluation System, Burn-in System and LCD processing Equipment.
经销产品主要包括各种模拟环境试验设备、线快速可靠性测试评估系统、导体老化筛选设备、晶热处理设备。 - This problem arises in the burn-in stage of semiconductor manufacturing.
这个问题来源于半导体制造过程中对芯片煅烧工序的排序。 - Study of thermal resistance of burn-in model of VLSI
VLSI老化模型参数热阻的研究 - Challenge of VLSI Burn-in Screen out Test Technology
VLSI老化筛选试验技术的挑战 - The system can execute surging and burn-in test at the same time, and has some advantages such as high smart automation, high test precision and high reliability.
该系统集浪涌、老化于一体，容量大，自动化程度高，操作简单，测试精度和可靠性高。 - Beginning with burn-in model, this paper describes the importance of thermal resistance a parameter of it.
从老化筛选模型入手，阐述了老化模型参数热阻的重要性。 - Study on the Technique about Thermal Resistance and Burn-in of Transistor Arrays
对晶体管阵列热阻和电老炼相关技术的探讨 - Design and Implementation of Temperature Measurement and Control System for Burn-in Chamber Based on Data Fusion
基于数据融合的老化室温度测量控制系统的设计与实现 - This paper describes the CAD method for MCM-C, the fabrication and metallization processes of MCM-C substrates, and the technologies for die test, burn-in and interconnection.
介绍了MCM－C的CAD设计方法，以及MCM－C基板的制作与金属化、芯片的测试和老化、芯片互连等工艺。 - Design of Embedded Graphic Generator for High Temperature Dynamic VLSI Burn-in Test System Using Programmable ASIC Technology
大规模集成电路高温动态老化测试嵌入式图形发生系统的可编程ASIC实现 - Study on the Burn-In Effect of Plasma Display Panels
等离子体显示屏万年残像现象的研究 - The main work of this paper could be summarized as follows: 1. Brief introduction to the embedded system and burn-in test technology.
对嵌入式系统和集成电路老化技术的介绍。 - The system can burn-in four hundred capacitors at the same time, automatically test their capacity value and bleeder current, and realize the function of automatic removing the damaged device.
系统可同时对400工位各类电容器进行老化，并自动测试电容值和漏电流，实现失效工位的自动剔除。 - Burn-in Screening of Power Tube Based on Continuous Operating of System
基于系统连续运行的功率管老炼筛选方法 - A Novel Surging and Burn-in Test System for Slice Capacitor
片式电容器浪涌及老化测试系统的设计与实现 - Graphic generator is the key subsystem of high temperature dynamic VLSI burn-in test system.
图形发生系统是大规模集成电路高温动态老化测试的核心子系统。 - The Effect of Current Burn-in on Life of Impulse Capacitors
电流老炼对脉冲电容器寿命的影响 - So a pulse power burn-in method has been proposed, which measure junction temperature by thermal parameters and control junction temperature by adjusting the power, frequency and duty of pulse to ensure the junction temperature meet the requirement of burn-in.
因此，参考GJB128A-97标准，提出了一种脉冲功率老炼的方法。采用热敏参数法来测量结温，同时调整脉冲的功率、频率和占空比来控制结温，使结温达到老炼要求。 - Theoretical analysis and experiments demonstrate that continuous pulse power burn-in method is feasible.
通过理论和实验证明了脉冲功率老炼方法的可行性，并在此基础上提出一种多器件串行脉冲功率老炼的方法流程。