Studies of the Error in Determining of the Thermal Coefficient of Nonconductor with the Method of Steady-state Plate 稳态平板法测不良导体导热率的误差的研究用稳态平板法测定不良导体导热系数的实验研究
Atomic Force Microscope ( AFM) is a new generation of Scanning Probe Microscope ( SPM). It not only can be used in conductor, semiconductor, nonconductor, but also can't be limited by periodicity. 原子力显微镜(AFM)是新一代的扫描探针显微镜(SPM),不仅可适用于导体、半导体、绝缘体样品,并且不受样品是否具周期性的限制;
Early Stage Electrodeposition of Copper on Nonconductor ABS Covered with Noncontinuous Pd Particulates and Morphology of the Copper Coating 在不连续Pd粒子覆盖的非导体表面电沉积铜的研究
The transparency of organic glass is good, but it is nonconductor and has no shielded efficiency. 有机玻璃透明性好,但为绝缘体因而不具有屏蔽效能。
AFM may be the most effective instrument to satisfy the demand of ITRS to improve the measurement precision constantly since its observed objects are not limited in nonconductor only. First, the working principle, imaging process, structure and working mode of AFM are studied. 由于不要求被测样本为非绝缘体,原子力显微镜将可能成为边缘粗糙度测量精度要求不断提高的最有效工具。首先分析了原子力显微镜的工作原理、测量过程、仪器结构和工作模式。